Abstract
In this article, we examined the electromechanical behavior of Sn-substituted Lead Bismuth Zirconate Titanate thin films (PBZST thin films). Using the pulsed laser deposition technique (PLD), the thin film growth parameters of bismuth-doped PZST close to MPB were adjusted by varying the ∼(Zr, Sn)/Ti ratios. Thin films (∼250 nm) with the stoichiometric formula Pb0.985Bi0.01(Zr0.7Sn0.3)xTi1 – xO3, (x = 0.935, 0.940, 0.945, and 0.950) were grown on a Pt/TiO2/SiO2/Si substrate using PLD technique at optimized conditions. P-E loop confirms that MPB is near x = 0.945, and further PFM measurements also confirmed the same. Analyzing the PFM phase and amplitude hysteresis loops, local piezo-electric coefficient and remnant strain values were computed as d33 = 330 pm/V and 0.33 at the MPB composition (x = 0.945).
Disclosure Statement
No potential conflict of interest was reported by the author(s).