Contribution of a Photoreactivable Component to the Oxygen Effect Observed in Certain Rad Mutants of Saccharomyces Cerevisiae after Exposure to High Energy Electrons

T.S. Tsyb Institute of Medical Radiology, Academy of Medical Sciences of the U.S.S.R., Obninsk, Kaluga Region, U.S.S.R.

N.G. Selyova Institute of Medical Radiology, Academy of Medical Sciences of the U.S.S.R., Obninsk, Kaluga Region, U.S.S.R.

N.M. Kabakova Institute of Medical Radiology, Academy of Medical Sciences of the U.S.S.R., Obninsk, Kaluga Region, U.S.S.R.

M.N. Myasnik Institute of Medical Radiology, Academy of Medical Sciences of the U.S.S.R., Obninsk, Kaluga Region, U.S.S.R.

O.N. Pakhomova Institute of Medical Radiology, Academy of Medical Sciences of the U.S.S.R., Obninsk, Kaluga Region, U.S.S.R.

Summary

It is shown that a fraction of damage induced by high energy electrons (25 MeV) in certain rad mutants of the yeast Saccharomyces cerevisiae can be photoreactivated. The photoreactivable damage contributes to the lethal effect of this type of irradiation and modifies the oxygen effect. Using photoreactivating light or nigrosin, the amount of photoreactivable damage is reduced and the oxygen enhancement ratio (OER) for yeast mutants increases approximately to the OER found in wild-type cells.

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Contribution of a Photoreactivable Component to the Oxygen Effect Observed in Certain Rad Mutants of Saccharomyces Cerevisiae after Exposure to High Energy Electrons

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Contribution of a Photoreactivable Component to the Oxygen Effect Observed in Certain Rad Mutants of Saccharomyces Cerevisiae after Exposure to High Energy Electrons

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