Abstract
Amorphous films of Sb2Se3 were studied for crystallization under the action of electron irradiation. Electron microscopy studies demonstrated, that phase transformation is the island polymorphous crystallization mode with the relative length δ0≈ 183 for a film with a thickness 25 nm and δ0≈ 489 for a film with a thickness 40 nm. The dependence of the fraction of the crystalline phase on time has an exponential character, described by the JMAK formula. For films of both thicknesses numerical value of Avrami exponent nearest integer = 2.
Acknowledgments
The authors are grateful to A.Yu. Sipatov and N.A. Reznik for the helpful discussions and assistance in sample preparation and research, and M.A. Sokol for assistance in the design of the article.
Disclosure statement
No potential conflict of interest was reported by the author(s).