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Original Article

A Scanning Electron Microscopic Evaluation of Section and Film Mounting for Transmission Electron Microscopy

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Pages 337-342 | Published online: 12 Jul 2009
 

Abstract

Mounting of support films and sections for transmission electron microscopy has been examined with the scanning electron microscope. Experiments have been designed to test the adherence of support films to polished and matte surfaces of specimen grids. It is the conclusion of the authors that sections and films should be mounted on the dull or matte surface of Athene-type specimen grids.

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