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Back Matter

Technometrics 2023 Associate Editors

The American Statistical Association and the American Society for Quality are grateful to all the Associate Editors who made the 2023 volume year of Technometrics a success.

Annie Booth, North Carolina State University

Claire Bowen, Urban Institute

Vera Bulaevskaya, Amazon

Giovanna Capizzi, University of Padua

Yong Chen, University of Iowa

Christopher Franck, Virginia Tech

Yulia Gel, University of Texas at Dalas

David Ginsbourger, Institute of Mathematical Statistics and Actuarial Science

Amanda Hering, Baylor University

Aparna Huzurbazar, Los Alamos National Laboratory

Youngdeok Hwang, Baruch College

Emily Kang, University of Cincinnati

Lulu Kang, University of Massachusetts

Andee Kaplan, Colorado State University

Devon Lin, Queen’s University

Lu Lu, University of South Florida

Simon Mak, Duke University

Amandine Marrel, CEA

Yajun Mei, Georgia Institute of Technology

Kamran Paynabar, Georgia Institute of Technology

Matthew Plumlee, Amazon

Tony Pourmohamad, Genetech

Matthew Pratola, The Ohio State University

Pritam Ranjan, Indian Institute of Management Indore

Elizabeth Schifano, University of Connecticut

David Steinberg, Tel Aviv University

Chih-Li Sung, Michigan State University

Xiao Wang, Purdue University

Maria Weese, Miami University

Joanne Wendelberger, Los Alamos National Laboratory

David Woods, University of Southampton

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