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Correction

Correction

This article refers to:
Comparison of surface properties, cell behaviors, bone regeneration and osseointegration between nano tantalum/PEEK composite and nano silicon nitride/PEEK composite

Article title: Comparison of surface properties, cell behaviors, bone regeneration and osseointegration between nano tantalum/PEEK composite and nano silicon nitride/PEEK composite

Authors: Hu G, Zhu Y, Xu F, Ye J, Guan J, Jiang Y, Di M, Li Z, Guan H, Yao X.

Journal: Journal of Biomaterials Science Polymer Edition.

Bibliometrics: Volume 33, Number 1, pages 35-56.

DOI: https://doi.org/10.1080/09205063.2021.1974812.

In the originally published paper, there was an error in Figure 1 as published. To reveal chemical groups and phase composition of the samples, it had been inadvertently replaced by the wrong sample number image of e and f when we used AI software to typeset for manuscript preparing. The corrected Figure 1 is shown below.

At the same time, there was an error in Figure 3 as published. To reveal the element distribution on the samples, it had been inadvertently replaced by the wrong sample number image of i, j, k, l when we used AI software to typeset for manuscript preparing. The corrected Figure 3 is shown below.

The authors apologize for the error and state that this does not change the scientific conclusions of the article in any way. The original article has been updated.

Figure 1. SEM image of Ta (a) and SN (b) particles, DLS of particle size distribution of Ta (c) and SN (d), and FTIR (e) and XRD (f) of Ta, SN, PEEK, TPC and SPC; * is characteristic peaks of PEEK, ● is characteristic peaks of Ta and ▼ is characteristic peaks of SN.

Figure 1. SEM image of Ta (a) and SN (b) particles, DLS of particle size distribution of Ta (c) and SN (d), and FTIR (e) and XRD (f) of Ta, SN, PEEK, TPC and SPC; * is characteristic peaks of PEEK, ● is characteristic peaks of Ta and ▼ is characteristic peaks of SN.

Figure 3. EDS elemental mapping of PEEK (a, d, g), TPC (b, e, h), and SPC (c, f, i), and distribution of carbon (C) element in red (a-c), tantalum in blue (d-f), silicon in green (g-i) on the samples, and EDS elemental spectra of PEEK (j), TPC (k) and SPC (l).

Figure 3. EDS elemental mapping of PEEK (a, d, g), TPC (b, e, h), and SPC (c, f, i), and distribution of carbon (C) element in red (a-c), tantalum in blue (d-f), silicon in green (g-i) on the samples, and EDS elemental spectra of PEEK (j), TPC (k) and SPC (l).

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