Abstract
Approaches and basic principles of the detailed analysis of force-distance data collected with scanning probe microscopy (SPM) are presented. We discuss nanomechanical probing routines for a single surface location and selected areas of polymer surfaces. Various approximations adapted for calculations of the surface elastic response and the adhesive forces are elaborated. Examples of SPM data analysis are discussed for compliant and hard polymer surfaces. The program package developed for the reliable processing of SPM data and the evaluation of nanomechanical properties is briefly described.