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Original Article

Ultra electron microscopy in the SEM and STEM modes

Pages 224-226 | Received 10 Nov 1997, Accepted 13 Dec 1997, Published online: 13 Oct 2016
 

Abstract

The approach, in this paper, to the subject of ultra electron microscopy, is based on the fundamental assumption, that the classical laws of electrodynamics and electrostatics, will apply at all levels of image formation, down to spacings which approach the electron diameter itself. The electron optical principles of ultra electron microscopy, are shown to be based on a phenomenon found in cold field-emission sources, namely, a phenomenon where the paraxial emission manifests an electron density which is orders of magnitude greater than the overall density of emission. It is argued, further, that the laws of electrodynamics and electrostatics will be valid, also, in regard to the constitution of the atom, and an example which supports that point of view, is shown.

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