Abstract
This review covers results of recent O.D.M.R. measurements of recombination processes in layered semiconductors, II–VI compounds, at dep traps and in amorphous compounds, and includes consideration of experimental aspects.
Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.
Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.
Notes
Based on unpublished invited paper presented at the International Conference on High Magnetic Field Measurements in Semiconductors, Oxford, 1978.