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Raman

Surface-Scanning Raman Characterization of Dark Materials Based on a Digital Mirror Device (DMD)

, , , & ORCID Icon
Pages 2423-2430 | Received 13 Oct 2020, Accepted 24 Dec 2020, Published online: 11 Jan 2021
 

Abstract

When Raman spectroscopy is used for material analysis, a laser is focused on the sample by a lens. Dark materials have a stronger ability to absorb light and hence the laser may heat these samples to the ignition point. Thus, Raman spectroscopy of dark materials is a challenging problem. High-frequency surface scanning technology based on a digital mirror device and Lissajous pattern modulation is presented in this study. The scanning was performed according to a given path in the detection process and the sampling area was changed from point source detection to area source detection. In addition, the optical structure of the handheld Raman spectrometer was optimized by changing relevant optical components. In addition, the detection efficiency and detection limit were improved so that its performance was significantly enhanced.

Acknowledgements

We thank LetPub for its linguistic assistance during the preparation of this manuscript.

Additional information

Funding

This research was supported by the National Natural Science Foundation of China (grant number 62003047) and Shenzhen Science and Technology Program (JSGG20191129105842769).

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