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Abstract
Delayed X-ray spectrometry preceded by fast neutron activation, is a relatively novel application and its capabilities as an analytical tool for the specific determination of Os and Ir in small powdered samples was evaluated. The investigation took the form of a feasibility study which relied heavily on the high sensitivity of the detector used. Detection of the delayed X-rays was achieved with a 100 mm2 Ge detector whose ability to produce optimum photopeak-to-noise ratios formed the basis exploited in this investigation. Analytical conditions are demonstrated over a range of concentrations for the elements of interest and the potential of the technique for application to the general routine analysis of Os and Ir is discussed. We indicate that interferences from the sample matrix can be suppressed to a degree which makes the method almost independent of the matrix. This and other attractive features make the technique a strong rival to conventional activation analysis.