Publication Cover
Applicable Analysis
An International Journal
Volume 78, 2001 - Issue 3-4
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Original Articles

Thin-film capacitance models

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Pages 415-451 | Received 25 Nov 2000, Published online: 23 Jun 2010
 

Abstract

Models for distributed capacitance in a thin film are derived in the form of a system of local RC diffusion equations coupled by a global elliptic equation. Such models contain the local geometry of the distributed capacitance on which charge pis stored and the exchange of current flux on its interface with the medium. Certain singular limits are characterized, and the resulting degenerate initial-boundary-value problems are shown to be well posed.

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