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Abstract
The ferroelectric semiconductors Zn1−xLixO have been studied by using a micro-probed Raman scattering technique. At room temperature, the orientation of a small single crystal was determined by the angular dependence study of the peak intensity of Raman spectra. For the ceramics and single-crystal samples, Raman spectra show a small anomaly near the transition temperature. A slight cusp appears in the temperature dependence of the peak position of A1(z) and E2modes. Because of the lack of the drastic change in the Raman spectra, it is concluded that the structural distortion is very small and the phonon does not play an important role in this phase transition.