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Abstract
A quantitative study of the preferred orientation of lanthanum and calcium modified lead titanate thin films, including the measurement of pole figures and calculation of orientation distribution function (OD), is presented. The main preferential orientation components are identified as <001> and <100> perpendicular to the film surface. Variations of the texture strength and the contribution of these components to the final texture are observed with changes in the film thickness or the substrate used. These variations are correlated to the ferroelectric properties of these films. This information can be used to optimise the preparation process to obtain improved thin films for pyroelectric and piezoelectric applications.
