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For freedom from zigzag defects in SSFLCD, it is important to research in detail the effect of surface smoothness of substrate on the chevron layer structure. We have studied the effect of surface roughness of undercoating layer on the surface smoothness of alignment film and then the alignment structure of SSFLC. Furthermore, we suggest a model for explaining the freedom from defects in a SSFLC by investigating theoretically the free energy of Cl and C2 chevron structure.
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