Ellipsometric study of optical properties of oriented SBT thin films

D. Mo State Key Laboratory of Ultrafast Laser Spectroscopy, Institute of Condensed Matter Physics and Department of Physics, Zhongshan University, Guangzhou, 510275, China; Department of Electronic Engineering and Material Science and Technology Research Center, The Chinese University of Hong Kong, Shatin, N. T., Hong Kong, China; Department of Applied Physics and Materials Research Centre, The Hong Kong Polytechnic University, Hung Hom, Hong Kong, China

J. B. Xu Department of Electronic Engineering and Material Science and Technology Research Center, The Chinese University of Hong Kong, Shatin, N. T., Hong Kong, China

Y. Liu Normal College, Shenzhen University, Shenzhen, 518060, China

G. D. Hu Department of Electronic Engineering and Material Science and Technology Research Center, The Chinese University of Hong Kong, Shatin, N. T., Hong Kong, China

Abstract

The SrBi₂Ta₂O₉ films of (200) and (0010) predominant orientation were prepared by metalorganic decomposition. Ellipsometric spectra of these oriented films were measured and analyzed in the range of photon energy from 2 to 5.5eV. The ellipsometric spectra of the (200)-predominant SBT films are different from those of the (0010)-predominant films. Basing on a simplified model, the effective refractive index n and the effective extinction coefficient k of both oriented SBT films were obtained. In the photon energy range of 2–5.5eV, the n value of the (0010)-predominant film is bigger than that of the (200)-predominant film (δn / 0.2 at 500nm). The band gap of the SBT thin films is found to be about 3.8eV.

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Ellipsometric study of optical properties of oriented SBT thin films

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Ellipsometric study of optical properties of oriented SBT thin films

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