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Session C: Relaxor ferroelectrics

The influence of processing on properties and microstructure of Bi4-xLaxTi3O12 thin films

, , , &
Pages 59-64 | Received 03 Aug 2001, Published online: 25 Oct 2011
 

Abstract

The Bi4-xLaxTi3O12 (x=0.75) thin films were prepared by RF magnetron sputtering and MOD techniques. The MOD-derived thin films show good ferroelectric properties and microstructure and the sputtered thin films have rougher surface and inhomogeneous microstructure.

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