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Regular papers

Appearance of ferroelectricity in thin SxSe1-x crystalline films

Pages 233-242 | Received 24 Oct 2000, Accepted 22 Mar 2001, Published online: 09 Mar 2011
 

Abstract

Appearance of ferroelectricity has been predicted in the SxSe1-x (x=0.08-0.18) single crystalline films (thickness below 5 nm) using quantum chemical and molecular dynamics simulations. Direct measurements of the spontaneous polarization show appearance of the ferroelectricity for the film thickness below 5 nm with sulfur content × = 0.10-0.30. Inelastic neutron scattering and Raman measurements confirms substantial role of electron-phonon anharmonicity in the observed ferroelectric phase transition

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