Scanning Near-Field Raman Microscopy on Ferroelectrics

By combining scanning atomic force microscopy with micro-probed Raman scattering spectroscopy, we have developed a new type of scanning near-field Raman scattering system. A special designed cantilever with aperture of about 150 nm in diameter was used both as an illumination nano-source and a nano-detector of scattering light. Near-field Raman spectra of internal modes in TGS and GMO single crystals were observed at their cleavage surfaces at room temperature. The results are compared with those obtained by a conventional Raman microscope.

Keywords:

• Near-field
• Scanning Microscopy
• Raman Scattering
• Internal Modes
• Nano-scale