Splitting of the XPS in Ferroelectric SbSI Crystals

The paper presents the X-ray photoelectron spectra (XPS) of the valence band and core levels of the ferroelectric SbSI single crystal. Results revealed the new phenomenon--splitting of the core levels at the phase transition temperature T cl . The XPS are measured with monochromatized Al K f radiation in the energy range 0-1400 eV and the temperature range 130-330 K. Experimentally obtained energies are compared with the results of theoretical ab initio calculations. This is the first observation of the splitting of the XPS in a ferroelectric crystal. The mechanism of the XPS splitting in SbSI crystals is discussed.

Keywords:

• X-Ray Photoelectron Spectra
• Sbsi
• Band Structure