Thin Films of Perovskite Relaxor Ferroelectrics

Abstract

Epitaxial heterostructures of perovskite relaxor ferroelectric (RFE) thin films were grown by pulsed laser deposition. Dielectric properties of the heterostructures were studied as a function of frequency (10²–10⁶ Hz), temperature (77–725 K), and amplitude of applied ac electric field (10³–10⁶ V/m). The true properties of the films were reconstructed and analyzed. Generally in the films, the typical features of RFE were found to be essentially similar to those in single crystals. Also indications of proximity of the glass-like state to ferroelectric one were obtained. Positions of dielectric maxima T _m could not be directly related to thickness and/or tetragonal strain.

Keywords:

• Relaxor ferroelectric
• dielectric
• thin films