Multimode Atomic Force Microscopy of Triglycine Sulfate Crystal Domain Structure

Abstract

The same crystal surface regions in a triglycine sulfate (TGS) ferroelectric crystal were probed by varied SPM methods, namely contact and intermitted-contact AFM, piezoresponce force microscopy (PFM), scanning Kelvin microscopy (SKM) and electrostatic force microscopy (EFM). Criteria for identification of real (dynamic) domains and morphologically similar domain “memory” regions are proposed. Inaccuracy in identification may result in further errors in estimating the parameters of the domain structure. The images of ferroelectric domains in the spreading-resistance mode that directly indicate a contribution from an enhanced conductivity in the vicinity of the domain walls have been obtained for the first time.

Keywords:

• TGS crystal
• AFM
• SKM
• EFM
• PFM

Acknowledgments

We are grateful to Professor T.R.Volk for the help. This study was supported by the State Program for Support of Leading Scientific Schools, project no. NSh-5133.2006.2.