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SECTION B: DIELECTRIC AND MICROWAVE PROPERTIES

Investigation of Top/Bottom Electrode and Diffusion Barrier Layer for PZT Thick Film MEMS Sensors

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Pages 201-213 | Received 27 Aug 2007, Published online: 20 Sep 2010
 

Abstract

Top and bottom electrodes for screen printed piezoelectric lead zirconate titanate, Pb(Zr x Ti1 − x )O3 (PZT) thick film are investigated with respect to future MEMS devices. Down to 100 nm thick E-beam evaporated Al and Pt films are patterned as top electrodes on the PZT using a lift-off process with a line width down to 3 μ m. A 700 nm thick ZrO2 layer as insolating diffusion barrier layer is found to be insufficient as barrier layer for PZT on a silicon substrate sintered at 850°C. EDX shows diffusion of Si into the PZT layer.

Acknowledgment

This work is a result of the PiMEMS project which is a collaboration between MIC, InSensor A/S and Ferroperm Piezoceramics A/S and is supported by “The Danish National Advanced Technology Foundation.”

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