DC Electric Field Dependence of the Dielectric Constant of Pzt Thin Films Prepared by Polymeric Precursor Method

Abstract

This work reports dielectric measurements performed on Pb(Zr _0.53 Ti _0.47 )O ₃ (PZT) thin films prepared by a polymeric precursor method. The ε -E curves obtained for the PZT film measured at 100 kHz, under a small ac 0.2 kV/cm signal-test and a dc scan featured a typical butterfly curve. However, the ε -E curves obtained for PZT film under a dc scan, with a scan rate of ∼ 0.003 V/s, shows a pronounced asymmetry. The absence of a symmetric secondary peak in ε -E curves could be an indication of essentially 180° domain switching.

Acknowledgments

We would like express our gratitude to the Brazilian funding agencies Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq), to Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) and to Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) for financial support. Finally, we would like to thank Pró-Reitoria de Pós-Graduação da Unesp (PROPG) for their financial support for this work presentation.