Improved Dielectric Properties of Grain Oriented 0.9(Bi_0.5K_0.5)TiO₃-0.1BaTiO₃ Thick Films Prepared by Electrophoretic Deposition

Abstract

Dielectric properties of grain oriented 0.9(Bi_0.5K_0.5)TiO₃-0.1BaTiO₃ film were investigated in a process employing the electrophretic deposition (EPD) and templated grain growth (TGG) methods. A ceramic composition in Bi-based perovskite structure family, (Bi_0.5K_0.5)TiO₃-BaTiO₃, was chosen as a matrix material and platelike SrTiO₃ as a template. The TGG film specimens have 52% of a Lotgering factor with an index of grain orientation along [001]. The coercive fields for EPD film and its sequent TGG- processed film were 27.4 and 114.8 kV/cm, respectively. The dielectric constant of the EPD/TGG-film was 130.2, which is higher than that of EPD film specimen (83.9).

Keywords:

• BKT-BT
• Electrophretic Deposition
• template grain growth
• Hybrid

Acknowledgments

This research was supported by a grant from the Fundamental R&D Program for Core Technology of Materials funded by the Ministry of Knowledge Economy, Republic of Korea.