Abstract
Lead-free polycrystalline (K0.48Na0.52)1+x(Nb0.55Ta0.45)O3 (x = 0, 0.01, 0.02 and 0.03) thin films have been grown on Pt(111)/Ti/SiO2/Si substrates using KrF excimer laser ablation to investigate the effects of A-site ion excess. The film at x = 0.01 exhibited good ferroelectric hysteresis loop with a remnant polarization 2Pr of 30 μC/cm2 and coercive field 2Ec of 61 kV/cm. The piezoelectric coefficient d33,f of the KNNT film with x = 0.01 was found to amount to 79 pm/V. These improved ferroelectric and piezoelectric properties were attributed to the excess of A-site Na and K ions.
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