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Ferroelectrics Volume 493, 2016 - Issue 1
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Original Articles

Investigation of nanoscale domain switching of 0.94 Na0.5 Bi0.5TiO3-0.06 BaTiO3 thin film under different temperatures by piezoresponse force microscopy

K. ZhanSchool of Materials and Engineering, University of Shanghai for Science and Technology, Shanghai, ChinaCorrespondence[email protected]
,
M. SuSchool of Materials and Engineering, University of Shanghai for Science and Technology, Shanghai, China
,
H. HanSchool of Materials and Engineering, University of Shanghai for Science and Technology, Shanghai, China
&
X. Y. WangSchool of Materials and Engineering, University of Shanghai for Science and Technology, Shanghai, ChinaCorrespondence[email protected]
Pages 25-29 | Accepted 04 May 2015, Published online: 22 Feb 2016
 
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Abstract

The nanoscale domain switching behavior of 0.94 Na0.5 Bi0.5TiO3-0.06 BaTiO3 (NBT-BT6) thin film under different temperatures (25°C-225°C) is investigated by piezoresponse force microscopy (PFM) via the direct observation on their domain structure. The results show that the polycrystal structure with polydomain state is detected in NBT-BT6 thin film. With the temperature increasing, 90°domain switching is observed, however some domains near the grain boundary does not change. The domain switching is attributed to the residual stress induced by the grain deformation, and the grain boundary plays an active role in pinning a preferential polarization state.

Funding

This work is supported by NNSF of China (51272158), China Postdoctoral Science Foundation (2014M551427), and the Hujiang Foundation of China (B14006).

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