A comparative X-ray diffraction study of ferroelectric thin films and superlattices

Yu. A. TikhonovFaculty of Physics, Southern Federal University, Rostov-on-Don, RussiaCorrespondence[email protected]

I. N. ZakharchenkoFaculty of Physics, Southern Federal University, Rostov-on-Don, Russia

A. G. RazumnayaFaculty of Physics, Southern Federal University, Rostov-on-Don, Russia;Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, Amiens, France

Y. I. YuzyukFaculty of Physics, Southern Federal University, Rostov-on-Don, Russia

Sh. PavunnyDepartment of Physicsand Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico, USA

N. OrtegaDepartment of Physicsand Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico, USA

A. KumarDepartment of Physicsand Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico, USA

R. S. KatiyarDepartment of Physicsand Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico, USA

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ABSTRACT

A number of ferroelectric thin films with various barium concentration and two sets of superlattices with different composition and number of constituent layers were investigated using X-ray diffraction. Out-of-plane unit cell parameters, values of microstrains, and sizes of coherent scattering regions were determined. Modulation period for superlattices was also calculated. We discuss the structural features of the samples.

KEYWORDS:

Funding

This work was supported by the Russian Science Foundation (grant No. 14-12-00258).

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A comparative X-ray diffraction study of ferroelectric thin films and superlattices

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A comparative X-ray diffraction study of ferroelectric thin films and superlattices

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