Dielectric characteristics of novel composite nanomaterial

Abstract

Characteristic features of the PbZr_0.54Ti_0.46O₃ formation in etched swift heavy ion tracks and investigations of dielectric properties of the obtained structures are reported in this work. PbZr_0.54Ti_0.46O₃ compound is formed as a result of thermal treatment of film structures with identical composition being ion-beam sputtered on Si/SiO₂ substrates. During the temperature dependence studies of the Si/SiO₂ (PbZr_0.54Ti_0.46O₃) structure at various frequencies their dispersion is obtained. It is shown that in the temperature range from 360 to 406°С the frequency dependence of the dielectric permittivity reaches maximum values which is explained by the presence of a ferroelectric phase transition.

Keywords:

• silicon dioxide
• swift heavy ion tracks
• lead zirconate-titanate
• dielectric permittivity
• dielectric loss tangent

PACS:

• 41.75.-i
• 77.84.Dy
• 81.15.Cd
• 68.37.Ps
• 77.84.- s

Acknowledgments

The authors are grateful to M. Ploetner and B. Adolphi from the Dresden University of Technology for the measurements of the studied structures by means of the X-ray photoelectric spectroscopy. A support of the work in frames of the European project H2020-MSCA-RISE-2018-823942 ? FUNCOAT is gratefully acknowledged..