The measurement of space distribution of domains in polarized PZT ceramic

Abstract

A simple method for obtaining the space distribution of domains by measuring the X-ray diffraction pattern has been put forward in this article. The relation between the diffraction intensity (in (hkl)) and the polar axis [001] density distribution is discussed. While there is only one angle between (hkl) and (001), the distribution function of the polar axis [001] with respect to the zenith angle could be obtained as soon as the intensity of X-ray for the samples prior to and after polarization is measured. The space distribution of the domains in the sufficiently polarized ceramic PZT (Zr/Ti=50/50) has been calculated according to the technique as mentioned above, and the results were treated by the least square method. Generally, it has been previously shown that most of the distribution functions are Gaussian type, that is Wφ = W₀exp (−φ²/2δ²). However, our results show that W(φ) = 1/(1+α² φ²)² gives the best fit. Using the DEG (degree) unit system, the distribution function is W_ool(φ) = 1/[1+(0.01δφ)²]².