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Abstract
In recent years transmission electron microscopy (TEM) has proved to be a powerful tool for studying intimate scracture and defects in non - metallic crystals. The very first results obtained in this field reveal wide occurence of extended crystallogrphic defects and their direct relation to fundamental physical and chemical properties of dielectric compounds. Attention has been drawn to the fact that nonstoichiometry and basic properties of ferroelectric oxides with perovskite - type structure might be defined mainly by planar defects - cristallographic shear planes - rather than by classical point defects which usually considered in this connection.1/2