An electron microscopic investigation of grain boundary phenomena in 8/65/35 PLZT ceramics: Ferroelectrics: Vol 44, No 1

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Abstract

A detailed investigation of microstructure in abnormal crystal grain boundary (GB) migration regions was carried out by TEM and STEM+EDS. It was shown that the crystal orientation of those regions swept over by the migrated grain boundaries (MGBs) are readjusted as compared with their parent grains. Strain induced β-phase is confirmed around those regions as well

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An electron microscopic investigation of grain boundary phenomena in 8/65/35 PLZT ceramics

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An electron microscopic investigation of grain boundary phenomena in 8/65/35 PLZT ceramics

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