26
Views
16
CrossRef citations to date
0
Altmetric
Properties

Aging and after-effects in PLZT X/65/35 ferroelectric ceramics

, &
Pages 39-43 | Received 15 Sep 1988, Published online: 08 Feb 2011
 

Abstract

Temporal changes of dielectric parameters in PLZT X/65/35 (X = 0–13 at .% La) ferroelectric ceramics have been studied in a wide range of temperature. The results obtained have been discussed on the assumption that the effects of aging and after-effects originate from diffusion processes (point defect diffusion, domain and phase boundaries migration).

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.