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We report on a new novel method of quantifying the photorefractive effect (optically induced index change) of Ti-diffused LiNbO3 optical waveguides. The evolution and decay behavior of the photorefractive effect was investigated. The resistivity of Ti-diffused LiNbO3 estimated from the time constant of the relaxation process is about the same as the resistivity of bulk LiNbO3.
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