19
Views
0
CrossRef citations to date
0
Altmetric
Structure and properties

Some aspects of PLZT research in Shanghai Institute of Ceramics

&
Pages 123-130 | Received 02 Oct 1991, Published online: 10 Feb 2011
 

Abstract

Research on microstructure and related behaviour of 7.9/70/30 and 8/65/35 PLZT ceramics in Shanghai Institute of Ceramics, e.g., grain boundary migration, “clean regions,” lead deposition at grain boundaries, domain generation at grain boundaries when poling, grain boundary structure and moire patterns, are summarized. PLT thin film study is also briefly introduced.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.