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Ferroelectrics Volume 142, 1993 - Issue 1
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Theory

Characterization of dielectric crystals by light scattering tomography

Tomoya Ogawa Department of Physics, Gakushuin University, Mejoro, Tokyo, 171, Japan
Pages 19-29 | Received 14 Jan 1993, Published online: 10 Feb 2011
 
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Abstract

Optical characterization of dielectric crystals is very useful if they include heavy elements as constituent components of the crystals. The principle of light scattering tomography (LST), which has been developed as laser scanning ultramicroscopy, and some results obtained by LST are reviewed here.

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