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Section XIV: Thinfilm ferroelectrics: Experiments and materials

Dielectric and EPR measurements of the deuterated glass D-RADA x = 0.46

, , , , &
Pages 371-376 | Received 09 Aug 1993, Published online: 25 Feb 2011
 

Abstract

The results of the complex dielectric permittivity measurements and the spin-lattice relaxation times of the deuterated glass D-RADA x = 0.46, by the dielectric and EPR techniques are reported. The transition from paraelectric to antiferroelectric phase is detected at TN = 162 K. Below 90 K the dispersion of the complex dielectric permittivity was detected. The shape of the temperature dependence of the imaginary part of the dielectric permittivity was analyzed. This analysis shows the existence of two relaxation phases forming among the antiferroelectric domains, described by Arrhenius equation, and the glass state appears after the antiferroelectric ordering has been destroyed. The dielectric results are confirmed by the spin-lattice relaxation times data.

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