Ferroelectric domain wall studied by scanning electron microscopy and electron microscope decoration technique

Abstract

Scanning electron microscope (SEM) and electron microscope decoration technique are very useful in revealing domain structure in ferroelectrics. The resolution power of these methods depends, however, on the studied crystal and experimental conditions. We present conditions and restrictions of the two methods applied to domain wall studies.

Key Words:

• Ferroelectric domain wall
• scanning electron microscopy
• electron microscope decoration technique
• GASH