Raman investigation on sol-gel grown PbTiO3 thin films

Sol-gel prepared lead titanate thin films on platinum-coated silicon and on sapphire were studied. The frequency shift of the modes and the shift of the c-parameter with respect to the bulk material were associated with compressive stress in the films, which is not homogeneous. The PT films on silicon (6 h and 12 h) show an incomplete solid reaction, where an amorphous phase and the formation of TiO2 were found. However, near the edge of the PT films, perovskite phase was observed. On the other hand, the PT film on A1203 presents a polycrystalline perovskite structure, where a pyrochlore second phase was identified.

Keywords:

• Micro
• Raman
• lead titanate
• ferroelectric thin film