Surface analytical techniques: their developing role in the characterisation of surfaces, thin films and surface coatings

Summary

A number of techniques are now available for the characterisation of solid surfaces. In particular, techniques such as Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS or ESCA) and secondary ion mass spectrometry (SIMS) have become available which combine spatial resolution (of varying utility) with an ability to determine the composition of the outermost atomic layers (with varying precision and sensitivity). The remarkable depth resolution of these methods may also be exploited when used with surface sectioning techniques such as sputter-etching to provide composition-depth profiles. This paper is aimed at introducing the principles and analytical procedures of these techniques and at illustrating their potential areas of application in the materials finishing industry.