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Abstract
Most of the existing macromodels for integrated circuits (ICs) today have characteristics that are independent of temperature. The macromodels usually assume the IC operates at a fixed temperature, frequently taken to be a defined nominal temperature representing room temperature. This is in spite of the fact that IC characteristics are strongly dependent on the temperature of the device. In this paper, we discuss a methodology for thermal macromodelling of ICs to take into account the temperature dependence of the IC being modelled. The methodology may be used to convert a macromodel that models no thermal effects into one that models both thermal and electrothermal effects. The methodology is applied to a positive voltage regulator and is implemented in the circuit simulator PSpice.