Study of the relation between the surface loss and the field flatness in the EID

ABSTRACT

The relationship between surface loss and field flatness in extended interaction device (EID) has been studied. The field flatness can influence the surface loss in the circuit and hence the efficiency of the device without changing the operation mode. A W-band nine-slot extended interaction circuit operating in the 2π mode has been used in this article. As an oscillator, the nine-slot interaction circuit has different surface loss regions when the field flatness is different. In the study of EID, the operation point is mainly determined by the slow wave structure, but the field flatness should also be studied carefully for it influences the surface loss in the circuit and hence the efficiency of the device.

KEYWORDS:

• Extended interaction device
• field flatness
• mode
• surface loss
• W-band

Acknowledgements

This work was supported by the National Natural Science Foundation of China (Grant No. 61201011) and by the Fundamental Research Funds for the Central Universities (Grant No. ZYGX2013J056).

Disclosure statement

No potential conflict of interest was reported by the authors.

Additional information

Funding

This work was supported by the National Natural Science Foundation of China [grant number 61201011] and by the Fundamental Research Funds for the Central Universities [grant number ZYGX2013J056].