2,058
Views
63
CrossRef citations to date
0
Altmetric
Original Articles

OEE and equipment effectiveness: an evaluation

&
Pages 4987-5003 | Received 01 Nov 2005, Published online: 22 Feb 2007
 

Abstract

The overall equipment effectiveness or efficiency (OEE) is a metric that has been accepted in the semiconductor industry. OEE is simple and clear, and standards and guidelines have been developed. Nonetheless, the literature indicates imperfections in applying OEE with regard to the time base and rate efficiency. As OEE lacks a proper framework, the equipment effectiveness (E) has been developed based on a systematic approach to the equipment. E considers the effectiveness of the equipment with respect to availability, speed and quality losses. Unlike OEE, E is a performance measure for stand-alone equipment, isolated from the environment. In addition, E uses the available effective time as a basis in contrast to OEE, which uses the total time as a basis for measurement. Finally, due to the fact that E is measured directly by the production and effective time, it does not depend on the utilization of the equipment, unlike OEE. Furthermore, it has been shown that OEE does not indicate the influence of downtime and rework, whereas E gives these influences correctly.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.