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The Journal of Adhesion Volume 74, 2000 - Issue 1-4
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Original Articles

Atomic Force Microscope Techniques for Adhesion Measurements

D. M. Schaefer Department of Physics, Astronomy and Geosciences, Towson University, Towson, MD, 21252, USA
&
J. Gomez Dept. Fisica de la Materia Condensada, Universidad Autonoma de Madrid, 28049, Madrid, Spain
Pages 341-359 | Received 07 Jun 1999, Accepted 10 Sep 1999, Published online: 23 Sep 2006
 
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Abstract

The Atomic Force Microscope (AFM) has become a powerful apparatus for performing real-time, quantitative force measurements between materials. Recently the AFM has been used to measure adhesive interactions between probes placed on the AFM cantilever and sample surfaces. This article reviews progress in this area of adhesion measurement, and describes a new technique (Jump Mode) for obtaining adhesion maps of surfaces. Jump mode has the advantage of producing fast, quantitative adhesion maps with minimal memory usage.

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