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Abstract
Polydipropylsiloxane single crystals, grown from a dilute n-butylacetate solution, were characterized by electron microscopy and by selected-area electron-beam diffraction techniques. The electron diffraction study shows that the growth face was parallel to the (100) plane. Fracture of single crystals parallel to the fold plane takes place during the electron diffraction examination to give ribbon like lamellae about 300 A wide and 80 A thick. Fracture normal to the fold plane was also observed.