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Photographic Technology Supplement

Binary Filters for High Resolution Electron Microscopy

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Abstract

Binary fillers of the Lohmann and Paris typc are considered for the optical deblurring of electron images recorded under linear phase or amplitude conditions. Filter performance is tested indirectly by mean of simulated point spread function, and directly by the deblurring of an lIndcrfocused micrograph of ferritin. The results encourage further effort.

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