0
Views
0
CrossRef citations to date
0
Altmetric
Photographic Technology Supplement

A Granularity Measuring System Based on Standard Apparatus

&
Pages 81-84 | Received 12 Jun 1976, Published online: 22 Jul 2016
 

Abstract

A granularity measuring system has been developed whose main components are a single beam scanning microphotometer (a Zeiss Rapid Photometer GUI), which produces a voltage output proportional to the local transmission of the specimen, and a voltage sampling device (a Datran Classifier), which displays a histogram of this voltage. The granularity of the specimen may be computed from this in a few minutes by a simple hand method, or the results processed in bulk by computer.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.