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Abstract
A granularity measuring system has been developed whose main components are a single beam scanning microphotometer (a Zeiss Rapid Photometer GUI), which produces a voltage output proportional to the local transmission of the specimen, and a voltage sampling device (a Datran Classifier), which displays a histogram of this voltage. The granularity of the specimen may be computed from this in a few minutes by a simple hand method, or the results processed in bulk by computer.