Influence of the Space Charge Layer on the Topography of the Internal Latent Image

Partly presented on the 2nd International Symposium on Model Investigations of the Photographic Process and New Photoregistering Systems, 28 September to 5 October 1980, Varna, Bulgaria.

Abstract

An attempt is made to check the existence of a correlation between the concentration of space charge interstitials and the distribution of the internal latent image centres. It is shown that the topography of the internal latent image found by Malinowski and Karadjov in silver bromide emulsions fits very well the distribution of interstitials in the space charge layer. In this way it is demonstrated that in the subsurface region the probability for trapping and neutralization of the photogenerated electrons is proportional to the concentration of space charge interstitials. It is shown also that the fitting procedure reveals a possibility to calculate the free energies of formation of Frenkel defects on the surface as well as the other parameters of the space charge layer. The results obtained impose a renewed discussion about the influence of the space charge layer on the primary photographic process.

Notes

Partly presented on the 2nd International Symposium on Model Investigations of the Photographic Process and New Photoregistering Systems, 28 September to 5 October 1980, Varna, Bulgaria.