Addressing a Need for Valid Measures of Trait Reactance in Adolescents: A Further Test of the Hong Psychological Reactance Scale

Abstract

Research is scant concerning the developmental aspects of trait reactance. If measures are not validated for use across different age groups, it is difficult for researchers to investigate the specificities of reactance across the life span. So far, the factor structure and psychometric properties of the Hong Psychological Reactance Scale (HPRS) have not been tested in adolescents. In Study 1, using data from 1,301 Portuguese adolescents (M = 14.8 years), we conducted a confirmatory factor analysis to test a series of competing factor models. Post hoc modifications resulted in a bifactor model with acceptable fit. Bifactor statistical indexes showed that HPRS scores are unidimensional. Path analysis via structural equation modeling indicated HPRS scores were strongly related to scores from another measure of trait reactance. Study 2, using an independent sample of 327 Portuguese adolescents (M = 14.2 years), supported modeling the HPRS with a bifactor model. Finally, our results indicated HPRS scores were negatively correlated with indicators of emotional and cognitive well-being, supporting a conceptualization of reactance as patterns of negative cognitions and negative affect. Overall, this study indicates the HPRS is an appropriate measure for assessing trait reactance in adolescents.

Funding

This work was financed by the Foundation for Science and Technology, under Projects PTDC/MHC-CED/2224/2014 and UID/PSI/04375/2016.