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Abstract
In attribute sampling, product quality levels may be determined by solving the well-known binomial equation. Tables giving the quality levels for specified probabilities of lot acceptance are generated for a series of sampling plans. The importance of these tables is demonstrated through some applications in industrial quality control. Attribute sampling plans similar to Military Standard (MIL-STD) and Dodge-Romig are derived, and confidence intervals for the population proportion defective are obtained.
Additional information
Notes on contributors
V. P. Singh
Dr. Singh and Mr. Palanki are advisory engineers in the IBM System Products Division at East Fishkill, New York.